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US Patent Issued to Abbott Laboratories on Aug. 11 for "Methods for detecting assay interferents and increasing dynamic range" (Illinois Inventors)

ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,704,519, issued on Aug. 11, was assigned to Abbott Laboratories (Abbott Park, Ill.). "Methods for detecting assay interferents and increasing d... Read More


US Patent Issued to Research & Business Foundation Sungkyunkwan University on Aug. 11 for "Melanogenesis detection method using FAM86A" (South Korean Inventors)

ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,704,520, issued on Aug. 11, was assigned to Research & Business Foundation Sungkyunkwan University (Suwon-si, South Korea). "Melanogenesis dete... Read More


US Patent Issued to The General Hospital, Industry-Academic Cooperation Foundation, Yonsei University, Institute For Basic Science on Aug. 11 for "On-site rapid quantification of tetrahydrocannabinol" (South Korean, American Inventors)

ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,704,521, issued on Aug. 11, was assigned to The General Hospital Corp. (Boston), Industry-Academic Cooperation Foundation, Yonsei University (Se... Read More


US Patent Issued to Vitesco Technologies USA on Aug. 11 for "Three-dimensional shock detection using knock sensor and tuning fork" (American, French Inventors)

ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,704,522, issued on Aug. 11, was assigned to Vitesco Technologies USA LLC (Auburn Hills, Mich.). "Three-dimensional shock detection using knock ... Read More


US Patent Issued to Siemens Mobility on Aug. 11 for "Method for detecting a malfunction of a monitoring system" (German Inventors)

ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,704,523, issued on Aug. 11, was assigned to Siemens Mobility GmbH (Munich). "Method for detecting a malfunction of a monitoring system" was inv... Read More


US Patent Issued on Aug. 11 for "Method and apparatus for testing a semiconductor device" (South Korean Inventors)

ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,704,524, issued on Aug. 11. "Method and apparatus for testing a semiconductor device" was invented by ZunBae Moon (Gyeonggi-do, South Korea), W... Read More


US Patent Issued to Taiwan Semiconductor Manufacturing on Aug. 11 for "Testing apparatus and method of using the same" (Taiwanese Inventors)

ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,704,525, issued on Aug. 11, was assigned to Taiwan Semiconductor Manufacturing Co. Ltd. (Hsinchu, Taiwan). "Testing apparatus and method of usi... Read More


US Patent Issued on Aug. 11 for "Prefabricated rubber socket" (South Korean Inventors)

ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,704,526, issued on Aug. 11. "Prefabricated rubber socket" was invented by Jong Cheon Shin (Gyeonggi-do, South Korea) and Dong Ho Ha (Gyeonggi-d... Read More


US Patent Issued to POINT ENGINEERING on Aug. 11 for "Inspection device using electrically conductive contact pin" (South Korean Inventors)

ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,704,527, issued on Aug. 11, was assigned to POINT ENGINEERING Co. LTD. (Chungcheongnam-do, South Korea). "Inspection device using electrically ... Read More


US Patent Issued to Caterpillar on Aug. 11 for "Contact sensor for detecting loose sprocket segments of a final drive" (Illinois Inventor)

ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,704,528, issued on Aug. 11, was assigned to Caterpillar Inc. (Peoria, Ill.). "Contact sensor for detecting loose sprocket segments of a final d... Read More